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Charter agency · Albany County

KIPP Tech Valley Charter School, NY: schools, enrollment and spending

KIPP Tech Valley Charter School runs 1 public school with 840 students in grades K to 8. Its ratio of 19.1 students per teacher is 7.7 higher than the New York figure of 11.4.Listed in NCES data as "KIPP TECH VALLEY CHARTER SCHOOL".

At a glance

Schools
1
Students
840
Teachers (FTE)
44
Students per teacher
19.1
NY: 11.4 · US: 15.3
Address
321 Northern Blvd, Albany, NY 12210
County
Albany County
Locale
City: Midsize
Grades offered
K to 8
Agency type
Charter agency
NCES district ID
3600128
State district ID
NY-010100860867
Total staff (FTE)
104
School counselors (FTE)
3.0About 280 students per counselor.
School administrators (FTE)
3.0
Charter schools
1
Location from NCES coordinates. Map data OpenStreetMap contributors. Open larger map

Students per teacher compared

This district19.1
New York11.4
United States15.3

2020 finance data

From the F-33 School District Finance Survey for fiscal year 2020, in nominal dollars. Enrollment used for per-pupil figures is the finance survey count (857), which can differ from 2024-25 enrollment.
Total revenue
$0
Federal revenue
$0
State revenue
$0
Local revenue
$0
Total spending
$11.6 million
Spending per pupil
$13,581
Salaries
$6.3 million54.0% of total spending.
Long-term debt (end of year)
$0

Where revenue came from

New York overall

  • Federal: 4.5%
  • State: 37.7%
  • Local: 57.8%

Spending per pupil compared

This district$13,581
New York$30,973
United States$16,826

Schools in KIPP Tech Valley Charter School

By level: 1 elementary. A CEP school serves free meals to all students.
KIPP Tech Valley Charter SchoolCEP schoolCharterElementaryK to 884019.1

Nearby and related

Source: NCES Common Core of Data 2024-25 and F-33 finance 2020, via the Urban Institute Education Data Portal. Last reviewed October 2026. Finance figures are 2020 finance data in nominal dollars, not adjusted for inflation. Blank values are not available, not applicable or suppressed in the source. See the methodology.